IR interferometers using modern cameras

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3134, Issue , 1997, Pages 461-464

  Ai, Chiayu ^a  

^a WYKO Corporation   (United States)

Author keywords

Infrared system; Interferometer; Phase shifting; Surface roughness

Indexed keywords

BOLOMETERS; CAMERAS; FRICTION; INFRARED DEVICES; INTERFEROMETRY; MICROMETERS; OPTICAL INSTRUMENTS; REFRACTIVE INDEX; SURFACE PROPERTIES; SURFACE ROUGHNESS; SURFACES; TELEVISION CAMERA TUBES; THICKNESS MEASUREMENT;

BOLOMETER ARRAYS; CIRCULAR APERTURES; DISK DRIVES; FRINGE CONTRASTS; HIGH RESOLUTIONS; INCIDENT ANGLES; INCIDENT BEAMS; INFRARED SYSTEM; INTERFEROMETER; LASER INTERFEROMETERS (LDV); MEASUREMENT RESULTS; PHASE-SHIFTING; SPATIAL RESOLUTION (SR);

INTERFEROMETERS;

EID: 0005838817     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.295147     Document Type: Conference Paper

References (3)

1. Osuk Kwon, J. C. Wyant, and C. R. Haylett, App. Opt., 19, pp. 1862-1869, 1980.
2. J. H. Bruning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, and D. J. Brangaccio, "Digital wavefront measuring interferometer for testing optical surface and lenses," Applied Optics, v13, 2693-2703 (1974).
3. P. de Groot, "Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window," Applied Optics, v34 n22, 4723-4730 (1995).