|
Volumn 60, Issue 5, 1999, Pages 4150-4152
|
Beam-laser lifetime measurements for some selected levels in singly ionized thulium
a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0005823819
PISSN: 10502947
EISSN: 10941622
Source Type: Journal
DOI: 10.1103/PhysRevA.60.4150 Document Type: Article |
Times cited : (10)
|
References (13)
|