메뉴 건너뛰기




Volumn 15, Issue 3, 1997, Pages 538-543

High resolution electron energy loss spectroscopy study of vapor-deposited polyaniline thin films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005765182     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580680     Document Type: Article
Times cited : (9)

References (29)
  • 18
    • 85033312768 scopus 로고    scopus 로고
    • note
    • Exposure of films to atmospheric conditions for up to 48 h resulted in negligible oxidation and no spectral evidence of contamination.
  • 22
    • 85033319337 scopus 로고    scopus 로고
    • note
    • Estimated film thickness based on emeraldine exposure. Future experiments are planned to accurately measure film thicknesses.
  • 26
    • 85033306559 scopus 로고    scopus 로고
    • note
    • Modes characteristic of monosubstituted benzene rings are generally absent in the ir spectra of bulk polyaniline. The presence of these peaks in Fig. 2 thus suggests a shorter chain length for the vapor deposited polyaniline. A quantitative estimate of chain length, however, cannot be made based on HREEL data.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.