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Volumn 4, Issue 2, 1992, Pages 478-483

Structure and Chemistry of Silicon Nitride and Silicon Carbonitride Thin Films Deposited from Ethylsilazane in Ammonia or Hydrogen

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005736194     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm00020a044     Document Type: Article
Times cited : (20)

References (36)
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    • Girolami, G.S., Gozum, J.E. In Chemical Vapor Deposition of Refractory Metals and Ceramics ; Proc. Mater. Res. Soc. Symp., Besmann, T.M., Gallois, B.M., Eds., Materials Research Society: Pittsburgh, PA, 1990; Vol. 168, pp 319.
    • (1990) Chemical Vapor Deposition of Refractory Metals and Ceramics , vol.168 , pp. 319
    • Girolami, G.S.1    Gozum, J.E.2
  • 17
    • 11644304807 scopus 로고
    • Chang, R.P.H., Geis, M., Meyerson, B., Miller, D.A.B., Ramesh, R., Eds., Materials Research Society: Pittsburgh, PA
    • Bae, Y.W., Wilkens, B.J., Du, H., Gonsalves, K.E., Gallois, B. In Proc. 2nd Int. Conf. Electron. Mater, Chang, R.P.H., Geis, M., Meyerson, B., Miller, D.A.B., Ramesh, R., Eds., Materials Research Society: Pittsburgh, PA, 1990; p 507.
    • (1990) In Proc. 2nd Int. Conf. Electron. Mater , pp. 507
    • Bae, Y.W.1    Wilkens, B.J.2    Du, H.3    Gonsalves, K.E.4    Gallois, B.5
  • 25
    • 0001296902 scopus 로고
    • Smith, A.L. Ed., John Willey & Sons: New York
    • Anderson, D.R. Analysis of Silicones; Smith, A.L., Ed., John Willey & Sons: New York, 1974; p 247.
    • (1974) Analysis of Silicones , pp. 247
    • Anderson, D.R.1
  • 29
    • 85021483830 scopus 로고
    • Cardona, M., Ed., Springer-Verlag: Berlin Chapter 5.
    • Brodsky, M.H. In Light Scattering in Solids ; Cardona, M., Ed., Springer-Verlag: Berlin, 1975; Chapter 5.
    • (1975) Light Scattering in Solids
    • Brodsky, M.H.1
  • 35
    • 0003494870 scopus 로고
    • Vossen, J.L., Kern, W., Eds., Academic Press: New York
    • Kern, W., Ban, V.S. In Thin Film Processes; Vossen, J.L., Kern, W., Eds., Academic Press: New York, 1978; p 269.
    • (1978) In Thin Film Processes , pp. 269
    • Kern, W.1    Ban, V.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.