-
2
-
-
0027573836
-
Friction Microprobe Investigation of Particle Layer Effects on Friction
-
Blau, P. J., 1993, “Friction Microprobe Investigation of Particle Layer Effects on Friction,” Wear, Vol. 162-164, pp. 102-109.
-
(1993)
Wear
, vol.162-164
, pp. 102-109
-
-
Blau, P.J.1
-
3
-
-
85025229112
-
-
Bolz, R. E. and Tuve, G. L., eds., CRC Press, Cleveland, OH
-
CRC Handbook of Tables for Applied Engineering Science, 1973, Bolz, R. E. and Tuve, G. L., eds., CRC Press, Cleveland, OH, p. 332.
-
(1973)
, pp. 332
-
-
-
4
-
-
85025209469
-
-
Shackelford, J. F., Alexander, W., and Park, J. S., eds., CRC Press, Boca Raton, FL
-
CRC Materials Science and Engineering Handbook, 1994, Shackelford, J. F., Alexander, W., and Park, J. S., eds., CRC Press, Boca Raton, FL, p. 508.
-
(1994)
, pp. 508
-
-
-
5
-
-
0028320386
-
Hardness and Youngs Modulus of Amorphous a-SiC Thin Films Determined by Nanoindentation and Bulge Tests
-
El Khakani, M. A., Chaker, M., Jean, A., Boily, S., Kieffer, J. C., O’Hem, M. E., Ravet, M. F., and Rousseaux, F., 1994, “Hardness and Young’s Modulus of Amorphous a-SiC Thin Films Determined by Nanoindentation and Bulge Tests,” Journal of Material Research, Vol. 9, pp. 96-103.
-
(1994)
Journal of Material Research
, vol.9
, pp. 96-103
-
-
El Khakani, M.A.1
Chaker, M.2
Jean, A.3
Boily, S.4
Kieffer, J.C.5
O’hem, M.E.6
Ravet, M.F.7
Rousseaux, F.8
-
6
-
-
0028517901
-
Growth of Silicon Carbide Films via C® Precursors
-
Hamza, A. V., Balooch, M., and Moalem, M., 1994, “Growth of Silicon Carbide Films via C® Precursors,” Surface Science, Vol. 317, pp. LI129-LI135.
-
(1994)
Surface Science
, vol.317
, pp. LI129-LI135
-
-
Hamza, A.V.1
Balooch, M.2
Moalem, M.3
-
7
-
-
84944978915
-
Silicon Micromechanics: Sensors and Actuators on a Chip
-
Howe, R. T., Muller, R. S, Gabriel, K.J., and Trimmer, W. S. N., 1990, “Silicon Micromechanics: Sensors and Actuators on a Chip,” IEEE Spectrum, Vol. 27, pp. 29-35.
-
(1990)
IEEE Spectrum
, vol.27
, pp. 29-35
-
-
Howe, R.T.1
Muller, R.S.2
Gabriel, K.J.3
Trimmer, W.S.N.4
-
8
-
-
0004217652
-
-
Wiley, New York
-
Kingery, W. D., Bowen, H. K., Ulhmann, D. R., 1976, Introduction to Ceramics, Second Edition, Wiley, New York, p. 775.
-
(1976)
Introduction to Ceramics, Second Edition
, pp. 775
-
-
Kingery, W.D.1
Bowen, H.K.2
Ulhmann, D.R.3
-
9
-
-
0028256731
-
Nanoindentation Hardness Tests Using a Point Contact Microscope
-
Lu, C. J., Bogy, D., and Kaneko, R., 1994, “Nanoindentation Hardness Tests Using a Point Contact Microscope,” ASME Journal of Tribology, Vol. 116, pp. 175-180.
-
(1994)
ASME Journal of Tribology
, vol.116
, pp. 175-180
-
-
Lu, C.J.1
Bogy, D.2
Kaneko, R.3
-
10
-
-
0000156345
-
Using Force Modulation to Image Surface Elasticities with the Atomic Force Microscope
-
Maivald, P., Butt, H. J., Gould, S. A. C., Prater, C. B., Drake, B., Gurley, J. A., Elings, V. B„ and Hansma, P. K., 1991, “Using Force Modulation to Image Surface Elasticities with the Atomic Force Microscope,” Nanotechnology, Vol. 2, pp. 103-106.
-
(1991)
Nanotechnology
, vol.2
, pp. 103-106
-
-
Maivald, P.1
Butt, H.J.2
Gould, S.A.C.3
Prater, C.B.4
Drake, B.5
Gurley, J.A.6
Elings, V.B.7
Hansma, P.K.8
-
11
-
-
85025205282
-
-
Marshall, R. C., Faust, Jr., J. W., and Ryan, C. E., eds., University of South Carolina, Columbia, SC
-
Silicon Carbide-1973, Marshall, R. C., Faust, Jr., J. W., and Ryan, C. E., eds., University of South Carolina, Columbia, SC, p. 671.
-
(1973)
, pp. 671
-
-
-
12
-
-
0011713787
-
The Relation Between Load and Penetration in the Axisymmetric Boussinesq Problem for a Punch of Arbitrary Profile
-
Sneddon, I. N., 1965, “The Relation Between Load and Penetration in the Axisymmetric Boussinesq Problem for a Punch of Arbitrary Profile,” International Journal Engineering Science, Vol. 3, pp. 47-57.
-
(1965)
International Journal Engineering Science
, vol.3
, pp. 47-57
-
-
Sneddon, I.N.1
-
13
-
-
0000375672
-
Mechanical Properties of 3C Silicon Carbide
-
Tong, L., Mehregany, M., and Matus, L. G., 1992, “Mechanical Properties of 3C Silicon Carbide,” Applied Physics Letters, Vol. 60, pp. 2992-2994.
-
(1992)
Applied Physics Letters
, vol.60
, pp. 2992-2994
-
-
Tong, L.1
Mehregany, M.2
Matus, L.G.3
-
14
-
-
36448999468
-
Limits of Imaging Resolution for Atomic Force Microscopy of Molecules
-
Weihs, T. P., Nawaz, Z., Jarvis, S. P., and Pethica, J. B., 1991, “Limits of Imaging Resolution for Atomic Force Microscopy of Molecules,” Applied Physics Letters, Vol. 59, pp. 3536-3538.
-
(1991)
Applied Physics Letters
, vol.59
, pp. 3536-3538
-
-
Weihs, T.P.1
Nawaz, Z.2
Jarvis, S.P.3
Pethica, J.B.4
-
15
-
-
0001388136
-
Tip Artifacts in Atomic Force Microscope Imaging of Thin Film Surfaces
-
Westra, K. L., Mitchell, A. W., and Thomson, D. J., 1993, “Tip Artifacts in Atomic Force Microscope Imaging of Thin Film Surfaces,” Journal of Applied Physics, Vol. 74, pp. 3608-3609.
-
(1993)
Journal of Applied Physics
, vol.74
, pp. 3608-3609
-
-
Westra, K.L.1
Mitchell, A.W.2
Thomson, D.J.3
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