-
3
-
-
0001132007
-
-
Ciliberto, E.; Allen, G. C.; Di Stefano, C.; Fragalà, I.; Spoto, G. Anal. Chem. 1995, 67, 249A-253A.
-
(1995)
Anal. Chem.
, vol.67
-
-
Ciliberto, E.1
Allen, G.C.2
Di Stefano, C.3
Fragalà, I.4
Spoto, G.5
-
4
-
-
0040127358
-
-
Ciliberto, E.; Fragalà, I.; Mancini, N. A.; Spoto, G. Microsc. MicroanaL Microstruct. 1995, 6, 533-543.
-
(1995)
Microsc. MicroanaL Microstruct.
, vol.6
, pp. 533-543
-
-
Ciliberto, E.1
Fragalà, I.2
Mancini, N.A.3
Spoto, G.4
-
6
-
-
0000473250
-
-
Brandrup, J., Immergut, E. H., Eds.; John Wiley & Sons, Inc.: New York
-
Grulke, E. A. In Polymer Handbook, 3rd ed.; Brandrup, J., Immergut, E. H., Eds.; John Wiley & Sons, Inc.: New York, 1989; pp 519-559.
-
(1989)
Polymer Handbook, 3rd Ed.
, pp. 519-559
-
-
Grulke, E.A.1
-
7
-
-
0040535548
-
-
Billmeyer, F. W.; Kumar, R.; Saltzman, M. J. Chem. Educ. 1981, 58, 307-313.
-
(1981)
J. Chem. Educ.
, vol.58
, pp. 307-313
-
-
Billmeyer, F.W.1
Kumar, R.2
Saltzman, M.3
-
8
-
-
0003520774
-
-
John Wiley & Sons, Inc.: New York
-
Silverstain, R. M., Bassler, G. C., Morrill, T. C. Spectrometric Identification of Organic Compounds, 5th ed.; John Wiley & Sons, Inc.: New York, 1991.
-
(1991)
Spectrometric Identification of Organic Compounds, 5th Ed.
-
-
Silverstain, R.M.1
Bassler, G.C.2
Morrill, T.C.3
-
9
-
-
0001131849
-
-
Aggarwal, S., Russo, S., Eds.; Pergamon: Oxford
-
Montaudo, G.; Puglisi, C. In Comprehensive Polymer Science, 1st Suppl.; Aggarwal, S., Russo, S., Eds.; Pergamon: Oxford, 1992; pp 227-235.
-
(1992)
Comprehensive Polymer Science
, Issue.1 SUPPL.
, pp. 227-235
-
-
Montaudo, G.1
Puglisi, C.2
-
10
-
-
0024620567
-
-
Shedrinsky, A. M.; Wampler, T. P.; Indictor, N.; Baer, N. S. J. Anal. Appl. Pyrol. 1989, 15, 393-412.
-
(1989)
J. Anal. Appl. Pyrol.
, vol.15
, pp. 393-412
-
-
Shedrinsky, A.M.1
Wampler, T.P.2
Indictor, N.3
Baer, N.S.4
-
12
-
-
0003539132
-
-
Plenum Press: New York
-
Goldstein, J. I.; Newbury, D. E.; Echlin, P.; Joy, D. C.; Fiori, C.; Lifshin, E. Scanning Electron Microscopy and X-ray Microanalysir; Plenum Press: New York, 1989.
-
(1989)
Scanning Electron Microscopy and X-ray Microanalysir
-
-
Goldstein, J.I.1
Newbury, D.E.2
Echlin, P.3
Joy, D.C.4
Fiori, C.5
Lifshin, E.6
-
14
-
-
0003828439
-
-
Briggs, D., Seah, M. P., Eds.; John Wiley & Sons Ltd.: New York
-
Seah, M. P., Briggs, D. In Practical Surface Analysis: Auger and X-ray Photoelectron Spectroscopy, Briggs, D., Seah, M. P., Eds.; John Wiley & Sons Ltd.: New York, 1990; Vol. 1.
-
(1990)
Practical Surface Analysis: Auger and X-ray Photoelectron Spectroscopy
, vol.1
-
-
Seah, M.P.1
Briggs, D.2
-
15
-
-
0003459529
-
-
Chastain, J., Ed.; Perkin Elmer Corporation: Eden Prairie
-
Moulder, J. F.; Stickle, W. F.; Sobol, P. E.; Bomben, K. D. In Handbook of X-ray Photoelectron Spectroscopy; Chastain, J., Ed.; Perkin Elmer Corporation: Eden Prairie, 1992.
-
(1992)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Moulder, J.F.1
Stickle, W.F.2
Sobol, P.E.3
Bomben, K.D.4
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