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Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
Volumn 66, Issue 8, 2000, Pages 1221-1225
Development of real-time display system for contour line and equal-displacement line by phase shifting scanning moiré method
Author keywords

Contour line; Displacement measurement; Equal displacement line; Moir topography; Phase shifting; Real time; Scanning moir method; Shape measurement
Indexed keywords

EID: 0005496368     PISSN: 09120289     EISSN: None     Source Type: Journal    
DOI: 10.2493/jjspe.66.1221     Document Type: Article
Times cited : (7)
References (12)
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  • 2
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    • Japanese source
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  • 8
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    • Phase-shifting Grating Projection Moiré Topography
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  • 9
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    • Scanning Moiré Method for Obtaining Smooth Fringe Patterns
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    • Morimoto, Y.1    Yang, I.H.2    Cu, C.G.3
  • 12
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    • Fringe Pattern Analysis by Phase-shifting Method using Extraction of Characteristic
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.