Development of a multilayer thin-film solar control windshield

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 3, 1996, Pages 739-746

  Finley, J J ^a  

^a PPG INDUSTRIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005482731     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580381     Document Type: Article

References (18)

1. K. L. Moyer (private communication).
2. W. D. Johnston, J. Am. Ceram. Soc. 47, 198 (1964).
3. K. L. Moyer, Society of Automotive Engineers, paper No. 950052 (1995).
4. P. Young and R. Bernardi, Society of Automotive Engineers, paper No. 880050 (1988).
5. See, for example, R. K. Waits, in Thin Film Processes, edited by J. L. Vossen and W. Kern (Academic, Orlando, FL, 1978).
6. F. H. Gillery, R. C. Criss, and J. J. Finley, U.S. Patent No. 4,716,086 (29 December 1987); F. H. Gillery, R. C. Criss, and J. J. Finley, U.S. Patent No. 4,786,563 (22 November 1988).
7. F. H. Gillery, R. C. Criss, and J. J. Finley, U.S. Patent No. 4,716,086 (29 December 1987); F. H. Gillery, R. C. Criss, and J. J. Finley, U.S. Patent No. 4,786,563 (22 November 1988).
8. J. J. Finley, U.S. Patent No. 4,898,789 (6 February 1990).
9. F. H. Hart, U.S. Patent No. 4,462,883 (31 July 1984).
10. J. Szczyrbowski, U.S. Patent No. 5,201,926 (13 April 1993).
11. Transmittance and reflectance are expressed in terms of the tristimulus values, YR and YT, respectively. Reflected color is expressed in terms of the 2° observer CIE chromaticity coordinates (x,y). See, for example, F. W. Billmeyer, Jr. and M. Salzman, Principles of Color Technology (Wiley, New York, 1981). and references therein.
12. Illuminant A, which represents light from a blackbody radiator of absolute temperature 2856 K, is used for transmittance measurements in automotive glazing.
13. Illuminant D65 is intended to represent a phase of daylight with a correlated color temperature of 6500 K.
14. ANSI® Z26.1-1983.
15. Airco Coating Technology, Fairfield, CA.
16. J. J. Finley, U.S. Patent No. 4,806,220 (21 February 1989); U.S. Patent No. 4,898,790 (6 February 1990).
17. D. J. Wheeler and D. S. Chambers, Understanding Statistical Process Control (Statistical Process Controls, Knoxville, TN, 1986).
18. P. Moon, J. Franklin Inst. Nov., 583 (1940).