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Volumn 45, Issue 7, 1997, Pages 721-726

Ilościowa analiza mikrostrukturalna w skaningowym mikroskopie elektronowym (SEM) typowych gruntów polski

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005455390     PISSN: 00332151     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (9)

References (33)
  • 25
    • 0015869134 scopus 로고
    • Swedish Geotechnical Institute, Stockholm
    • SMART P. 1973 - Proc. Intern. Symp. Soil Struc., Swedish Geotechnical Institute, Stockholm: 69-76.
    • (1973) Proc. Intern. Symp. Soil Struc. , pp. 69-76
    • Smart, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.