Automatic embedding of a ferroelectric capacitor inside the circuit simulator Eldo

Proceedings of the IEEE International Workshop on Behavioral Modeling and Simulation, BMAS

Volumn 2001-January, Issue , 2001, Pages 97-101

  Zorzi, M ^a   Speciale, N ^a   Masetti, G ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Behavioral Modeling; CAD tool; Circuit simulation; Device Modeling; Ferroelectric Capacitor; Semiconductor

Indexed keywords

BEHAVIORAL RESEARCH; CAPACITORS; COMPUTER AIDED DESIGN; FERROELECTRIC DEVICES; FERROELECTRICITY; RECONFIGURABLE HARDWARE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS;

BEHAVIORAL MODEL; CAD TOOL; CIRCUIT SIMULATORS; COMMERCIAL CIRCUIT SIMULATORS; DEVICE MODELING; EFFICIENT SIMULATION; FERROELECTRIC CAPACITORS; LARGE CIRCUITS;

CIRCUIT SIMULATION;

EID: 0005452347     PISSN: 21603804     EISSN: 21603812     Source Type: Conference Proceeding    
DOI: 10.1109/BMAS.2001.962504     Document Type: Conference Paper

References (11)

1. "HDL-A Reference Manual", Mentor Graphics, 1995.
2. "Eldo UDM User's Manual", Mentor Graphics, 1999.
3. "SPECTRE HDL Reference", Cadence Design Systems, 1998.
4. V. R. Kasulasrinivas and H. W. Carter, "Modeling and Simulating Semiconductor Devices using VHDL-AMS" BMAS 2000
5. P. J. Ashenden, "The Designer's Guide to VHDL", Morgan Kaufmann Publishers, Inc. 1996.
6. "Eldo User's Manual" Mentor Graphics, 1998.
7. F. L. Cox, W. B. Kuhn, J. P. Murray and S. D. Tynnor, "Code-Level Modeling in XSPICE", Proc. of ISCAS'92. Vol 2, 1992, pp: 871-874.
8. A. Vladimirescu, "The SPICE Book", John Wiley & Sons, Inc. 1994.
9. T. Quarles, "Adding Devices to Spice3", Memorandum No. UCB/ERL M89/45 24 April 1989.
10. S. L. Miller, R. D. Nasby, J. R. Schwank, M. S. Rodgers and P. V. Dressendorfer, "Device modeling of ferroelectric capacitors" Journal of Appl. Phys. 68(12), 1990.
11. A. Sheikholeslami and P. G. Gulak, "A Survey of Circuit Innovations in Ferroelectric Random-Access Memories", Proc. of the IEEE, vol 88, May 2000.