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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 800-803

Scanning near-field optical microscopy/spectroscopy of thin organic films

(2) Nagahara, L A a Tokumoto, H b

a JT RES CENTER FOR ATOM TECHNOLOGY (Japan)

b NATL INST FOR ADV INTERDISC RES (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005399529 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.588716 Document Type: Article

Times cited : (7)

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