Imaging of organic molecular films using a scanning near-field optical microscope combined with an atomic force microscope

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 812-815

  Yamada, Hirofumi ^a   Tokumoto, Hiroshi ^a   Akamine, Shinya ^b   Fukuzawa, Kenji ^b   Kuwano, Hiroki ^b  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

^b NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005396991     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588719     Document Type: Article

References (4)

1. N. F. van Hulst, M. H. P. Moers, O. F. J. Noordman, R. G. Tack, F. B. Segerink, and B. Böiger, Appl. Phys. Lett. 62, 461 (1993).
2. Y. Inouye and S. Kawata, Opt. Lett. 19, 159 (1993).
3. S. Akamine, H. Yamada, and H. Kuwano (unpublished).
4. H. Yamada, Y. Hirata, M. Hara, and J. Miyake, Thin Solid Films 243, 455 (1994).