DX centers in Al0.3Ga0.7As/GaAs analyzed by point contact measurements

Journal of Applied Physics

Volumn 84, Issue 4, 1998, Pages 2034-2039

  Hauke, M ^a   Jakumeit, J ^a   Krafft, B ^b   Nimtz, G ^a   Forster A ^b   Luth H ^b  

^a UNIVERSITY OF COLOGNE   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005382317     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368261     Document Type: Article

References (12)

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