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Volumn 164, Issue 3, 1997, Pages 163-175

A quantification method in laser-ionization sputtered neutral mass spectrometry with a large acceptance volume of photoion detection

Author keywords

Ionization cross section; Laser ionization sputtered neutral mass spectrometry; Nonresonant multiphoton ionization; Quantification method; Volume effect

Indexed keywords


EID: 0005338961     PISSN: 01681176     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0168-1176(97)00093-1     Document Type: Article
Times cited : (3)

References (51)
  • 14
    • 30844473602 scopus 로고
    • A. Benninghoven, R.J. Colton, D.S. Simmons and H.W. Werner (Eds.), Secondary Ion Mass Spectrometry - SIMS V, Wiley, New York
    • W. Reuter, in: A. Benninghoven, R.J. Colton, D.S. Simmons and H.W. Werner (Eds.), Secondary Ion Mass Spectrometry - SIMS V, Springer Series in Chemical Physics 44, Wiley, New York, 1986.
    • (1986) Springer Series in Chemical Physics , vol.44
    • Reuter, W.1
  • 21
    • 0003776069 scopus 로고
    • A. Benninghoven, Y. Nihei, R. Shimizu and H.W. Werner (Eds.), Wiley, New York
    • S. Hayashi, in: A. Benninghoven, Y. Nihei, R. Shimizu and H.W. Werner (Eds.), Secondary Ion Mass Spectrometry - SIMS IX, Wiley, New York, 1994.
    • (1994) Secondary Ion Mass Spectrometry - SIMS IX
    • Hayashi, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.