Removing the image-doubling in shearography - Theory and application

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2944, Issue , 1996, Pages 247-255

  Waldner, Stephan ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

Displacement measurement; Image shearing speckle pattem interferometry; Shearography; Strain measurement

Indexed keywords

INTERFEROMETRY; SHEARING; SPECKLE; STRAIN GAGES; STRAIN MEASUREMENT;

DISPLACEMENT FIELDS; DISPLACEMENT INFORMATIONS; DISPLACEMENT MEASUREMENT; ELECTRONIC SPECKLE PATTERN INTERFEROMETRIES; EXPERIMENTAL VERIFICATIONS; IMAGE POINTS; IMAGE-SHEARING SPECKLE PATTEM INTERFEROMETRY; INDUSTRIAL ENVIRONMENTS; OPTICAL SETS; PHASE MAPS; PLANE DEFORMATIONS; SHEAROGRAPHY;

INTERFEROMETERS;

EID: 0005315495     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.259065     Document Type: Conference Paper

References (14)

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