SCOPUS 정보 검색 플랫폼

Physical Review B

Volumn 52, Issue 14, 1995, Pages 10395-10404

Measurements of magnetic screening lengths in superconducting Nb thin films by polarized neutron reflectometry

(6) Zhang, Huai a,b Lynn, J W a,b Majkrzak, C F b Satija, S K b Kang, J H c Wu, X D d

a UNIVERSITY OF MARYLAND (United States)

b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

c WESTINGHOUSE ELECTRIC COMPANY (United States)

d LOS ALAMOS NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005303366 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.52.10395 Document Type: Article

Times cited : (47)

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