Multilayer roughness and image formation in the Schwarzschild objective

Review of Scientific Instruments

Volumn 67, Issue 9, 1996, Pages 3355-

  Singh, S ^a   Solak, H ^a   Cerrina, F ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

BORON CARBIDES; MIRRORS; OPTICAL SYSTEMS; ROUGHNESS; RUTHENIUM; SCATTERING; SIGNAL TO NOISE RATIO; SPATIAL RESOLUTION; SURFACE COATING; SYNCHROTRON RADIATION; X RAY EQUIPMENT

Indexed keywords

EID: 0005300124     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.1147374     Document Type: Conference Paper

References (0)