메뉴 건너뛰기




Volumn 14, Issue 6, 1996, Pages 3663-3667

Effects of etch-induced damage on the electrical characteristics of in-plane gated quantum wire transistors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005298893     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588746     Document Type: Article
Times cited : (7)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.