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Volumn 13, Issue 2, 1983, Pages 333-346
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Defect spectroscopy with positrons: A general calculational method
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0005275769
PISSN: 03054608
EISSN: None
Source Type: Journal
DOI: 10.1088/0305-4608/13/2/009 Document Type: Article |
Times cited : (712)
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References (38)
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