Hierarchical characterization of analog integrated CMOS circuits

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 1998, Pages 636-643

  Eckmüller, Josef ^a,b   Gröpl, Martin ^a   Gräb, Helmut ^a  

^a SIEMENS AG   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG INTEGRATED CIRCUIT; CIRCUIT SIZING; CMOS CIRCUITS; FUNCTIONAL CONSTRAINTS; SIZING RULES; SUB-CIRCUITS; TOPOLOGY-INDEPENDENT;

CHARACTERIZATION; CMOS INTEGRATED CIRCUITS; LINEAR INTEGRATED CIRCUITS; TOPOLOGY;

ANALOG CIRCUITS;

EID: 0005270740     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1998.655925     Document Type: Conference Paper

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