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Applied Physics Letters

Volumn 69, Issue 5, 1996, Pages 662-664

A near-field scanning optical microscopy study of the uniformity of GaAs surface passivation

(2) Liu, Jutong a Kuech, T F a

a University of Wisconsin Madison (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005253890 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.117798 Document Type: Article

Times cited : (7)

References (16)

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