Absolute measurement of penetration depth in a superconducting film by the two-coil technique

Applied Physics Letters

Volumn 75, Issue 24, 1999, Pages 3865-3867

  Wang, R F ^a   Zhao, S P ^a   Chen, G H ^a   Yang, Q S ^a  

^a INSTITUTE OF PHYSICS   (China)

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[No Author keywords available]

Indexed keywords

EID: 0005076881     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125482     Document Type: Article

References (16)

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7. Equation (1) can be used under the condition d≪λ, keeping in mind that it is not valid as d→0 since this leads to an infinite M. For more general cases, which include d→0 and d/≫λ, Eq. (2) should he used instead.
8. A. T. Fiory, A. F. Hebard, P. M. Mankiewich, and R. F. Howard, Phys. Rev. Lett. 61, 1419 (1988).
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13. c-ΔT.
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15. Random scattering at the film surfaces is assumed for Eq. (3). However, the difference is small when the surface scattering is taken as specular. See Ref. 2.
16. D. K. Finnemore, T. F. Stromberg, and C. A. Swenson, Phys. Rev. 149, 231 (1966).