High-sensitivity ferromagnetic resonance measurements on micrometer-sized samples

Applied Physics Letters

Volumn 70, Issue 20, 1997, Pages 2756-2758

  Zhang, S ^a   Oliver, S A ^b   Israeloff, N E ^b   Vittoria, C ^b  

^a Hittite Microwave Corporation   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005068884     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118974     Document Type: Article

References (4)

1. See, for example, J. A. Weil, J. R. Bolton, and J. E. Wertz, Electron Paramagnetic Resonance (Wiley, New York, 1994), p. 500.
2. H. Dötsch, P. Röschmann, and W. Schilz, Appl. Phys. 15, 167 (1978).
3. P. Dorsey, S. A. Oliver, C. Vittoria, M. A. Wittenauer, and F. J. Friedlander, IEEE Trans. Magn. 28, 2450 (1992).
4. J. B. Knorr and J. Saenz, IEEE Trans. Microwave Theory Tech. 21, 579 (1973).