Direct atomistic observation of grain boundary sliding ii. silicon including boundary glass phase

Materials Science Forum

Volumn 304-306, Issue , 1999, Pages 561-566

  Kizuka, T ^a   Hosoki, K ^a   Deguchi, S ^b   Naruse, M ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

Author keywords

Atomic mechanics; Grain boundary sliding; High resolution transmission electron microscopy; In situ observation; Piezodriving

Indexed keywords

EID: 0005050301     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.304-306.561     Document Type: Article

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