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Volumn 16, Issue 3, 1998, Pages 1479-1483

Atomic force microscopy correlated with spectroscopic ellipsometry during homepitaxial growth on GaAs(111) B substrates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005045466     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589970     Document Type: Article
Times cited : (4)

References (13)
  • 1
    • 0022674356 scopus 로고
    • D. L. Smith, Solid State Commun. 57, 919 (1986); C. Mailoit and D. L. Smith, Phys. Rev. B 35, 1242 (1987).
    • (1986) Solid State Commun. , vol.57 , pp. 919
    • Smith, D.L.1
  • 2
    • 0022674356 scopus 로고
    • D. L. Smith, Solid State Commun. 57, 919 (1986); C. Mailoit and D. L. Smith, Phys. Rev. B 35, 1242 (1987).
    • (1987) Phys. Rev. B , vol.35 , pp. 1242
    • Mailoit, C.1    Smith, D.L.2
  • 10
    • 11744354042 scopus 로고    scopus 로고
    • Digital Instruments, Santa Barbara, CA.
    • Digital Instruments, Santa Barbara, CA.
  • 11
    • 11744365027 scopus 로고    scopus 로고
    • EPI Application Note, EPI MBE Prod. Group, Saint Paul, MN 55110, August/September 1993
    • EPI Application Note, EPI MBE Prod. Group, Saint Paul, MN 55110, August/September 1993.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.