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Volumn 16, Issue 3, 1998, Pages 1479-1483
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Atomic force microscopy correlated with spectroscopic ellipsometry during homepitaxial growth on GaAs(111) B substrates
a a a a,b a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0005045466
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.589970 Document Type: Article |
Times cited : (4)
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References (13)
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