Limits on quality factors of localized defect modes in photonic crystals due to dielectric loss

Journal of Applied Physics

Volumn 84, Issue 11, 1998, Pages 6299-6304

  Ueta, Tsuyoshi ^a   Ohtaka, Kazuo ^a   Kawai, Noriko ^b   Sakoda, Kazuaki ^b  

^a CHIBA UNIVERSITY   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005034537     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368952     Document Type: Article

References (19)

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