Enhancement of the spectroscopic method for mapping microwave fields in tokamak plasmas

Review of Scientific Instruments

Volumn 70, Issue 1 II, 1999, Pages 363-367

  Gavrilenko, V P ^a   Oks, E ^b  

^a Ctr for Surface and Vacuum Research   (Russian Federation)

^b AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005014299     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149505     Document Type: Article

References (10)

1. E. Oks, Plasma Spectroscopy: The Influence of Microwave and Laser Fields, Springer Series on Atoms and Plasmas (Springer, Berlin, 1995), Vol. 9.
2. V. P. Gavrilenko and E. Oks, Sov. Tech. Phys. Lett. 10, 609 (1984).
3. I. N. Polushkin, M. Yu. Rjabikin, Yu. M. Shagiev, and V. V. Yazenkov, Sov. Phys. JETP 62, 953 (1985).
4. V. S. Letokhov and V. P. Chebotaev, Nonlinear Laser Spectroscopy (Springer, Berlin, 1977).
5. N. B. Delone and V. P. Krainov, Atoms in Strong Light Fields (Springer, Berlin, 1985).
6. V. P. Gavrilenko and E. Oks, J. Phys. B 28, 1433 (1995).
7. V. P. Gavrilenko and E. Oks, Phys. Rev. Lett. 74, 3796 (1995).
8. M. Diegelmann, W. G. Wrobel, and K. Hohla, Appl. Phys. Lett. 33, 525 (1978).
9. T. Kajiwara, M. Inoue, T. Okada, M. Maeda, K. Muraoka, and M. Akazaki, Jpn. J. Appl. Phys., Part 1 24, 870 (1985).
10. Ph. Mertens and P. Bogen, Appl. Phys. A: Solids Surf. 43, 197 (1987).