Advanced baffles: Knife-edged diffuse-absorptive and dual reflective baffles

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1753, Issue , 1993, Pages 196-209

  Seals, Roland D ^a   McIntosh, Malcolm B ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BERYLLIUM; SIGNAL TO NOISE RATIO; STRAY LIGHT;

ADVANCED MATERIALS; OPTICAL CHARACTERISTICS; SIGNAL TO NOISE;

OPTICAL SYSTEMS;

EID: 0004944549     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.140716     Document Type: Conference Paper

References (14)

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8. Thomas, J., and Stavroudis, N., Lockheed Missiles and Space Co., Inc., Sunnyvale, CA, private communication
9. Jessen, Phil, Physitron, Inc., private communication
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11. Lowden, R. A., Oak Ridge National Laboratory Metals and Ceramics Division, private communication
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13. Shepard, D. F., Pompea, S. M., and Anderson, S., "The Effects Of Elevated Temperatures on the Scattering Properties of an Optical Black Surface at 0.6328 and 10.6 Micrometers, " Proc. SPIE, 967, pp. 286-291 (1988)
14. Pompea, S. M., Shepard, D. F., and Anderson, S., "BRDF Measurements at 6328 Angstroms and 10.6 Micrometers of Optical Black Surfaces for Space Telescopes, "Proc. SPIE, 967, pp. 236-247, (1988)