Technique for determining a prudent voltage stress to improve product quality and reliability

Microelectronics Reliability

Volumn 40, Issue 8-10, 2000, Pages 1615-1618

  Blish II, Richard C ^a   Black, J Courtney ^a   Hui, Ben ^a   Prince, Don T ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004915432     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00180-3     Document Type: Article

References (2)

1. nd Edition). Van Nostrand Reinhold, New York, 1995
2. Elsayed, Reliability Engineering. Addison Wesley, MA, 1996