Dependability Evaluation of Integrated Hardware/Software Systems

IEEE Transactions on Reliability

Volumn R-36, Issue 4, 1987, Pages 440-444

  Stark, George E ^a  

^a MITRE CORPORATION   (United States)

Author keywords

Availability; Semi Markov process; Transition probability

Indexed keywords

EID: 0004896440     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1987.5222435     Document Type: Article

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