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Volumn 82, Issue 12, 1997, Pages 6056-6061

Fracture toughness estimation of thin chemical vapor deposition diamond films based on the spontaneous fracture behavior on quartz glass substrates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0004843486     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366473     Document Type: Article
Times cited : (8)

References (14)
  • 11
    • 85033188970 scopus 로고    scopus 로고
    • Toshiba Ceramics Co., Ltd., Quartz and Silica Glass Ref. No. TC086-86.04.2A
    • Toshiba Ceramics Co., Ltd., Quartz and Silica Glass Ref. No. TC086-86.04.2A.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.