Correlation-length–exponent relation for the two-dimensional random Ising model

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 61, Issue 1, 2000, Pages 147-152

  Lajkó, Péter ^a   Iglói, Ferenc ^a,b  

^a UNIVERSITY OF SZEGED   (Hungary)

^b WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ITERATIVE METHODS; NUMERICAL METHODS;

CORRELATION LENGTHS; CRITICAL TEMPERATURES; DECAY EXPONENTS; EQUAL PROBABILITY; NUMERICAL PRECISION; SQUARE LATTICES; STAR-TRIANGLE TRANSFORMATION; SURFACE CORRELATION FUNCTIONS;

ISING MODEL;

EID: 0004830877     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.61.147     Document Type: Article

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39. In principle one could study much larger strips, for example in the perfect system one can easily go up to (Formula presented). For the random system, however, there occur regions in the sample with many weak (or strong) couplings and therefore the iteration procedure could become numerically instable with increasing width of the system.