Studies of periodic ferroelectric domains in (formula presented) using high-resolution x-ray scattering and diffraction imaging

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 22, 1999, Pages 14259-14264

  Risk, W P ^b   Thomas, P A ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004822437     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.14259     Document Type: Article

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