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Volumn 65, Issue 1, 1998, Pages 71-75

Effect of the T-stress in microcrack shielding problems

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EID: 0004796001     PISSN: 00218936     EISSN: 15289036     Source Type: Journal    
DOI: 10.1115/1.2789048     Document Type: Article
Times cited : (8)

References (25)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.