Scanning tunneling microscopy investigation of single electron tunneling in Co-Al-O and Cu-Al-O granular films

Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 6331-6333

  Takanashi, K ^a   Mitani, S ^a   Chiba, J ^a   Fujimori, H ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004784841     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372696     Document Type: Article

References (10)

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