Observation and discrimination of the mode patterns in a micron-sized hollow optical fiber and its synthetic measurements: Far-field micro-imaging technique

Optical Engineering

Volumn 37, Issue 8, 1998, Pages 2277-2283

  Yin, Jianping ^a,b,c   Kim, Kihwan ^a   Shim, Wooshik ^a   Zhu, Yifu ^b   Jhe, Wonho ^a,d  

^a Seoul National University   (South Korea)

^b FLORIDA INTERNATIONAL UNIVERSITY   (United States)

^c SOOCHOW UNIVERSITY   (China)

^d Ctr Nearfield Atom Photon Technol   (South Korea)

Author keywords

Far field micro imaging; Fiber test; Hollow optical fiber; Mode discrimination; Mode observation

Indexed keywords

EID: 0004782563     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601748     Document Type: Article

References (36)

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