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Volumn 54, Issue 5, 1998, Pages 656-659

Structural investigation of biphenyl derivatives

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0004779056     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270197017939     Document Type: Article
Times cited : (12)

References (8)
  • 3
    • 85034464723 scopus 로고
    • PhD thesis, University of Göttingen, Germany
    • Jussofie, M. I. (1984). PhD thesis, University of Göttingen, Germany.
    • (1984)
    • Jussofie, M.I.1
  • 4
    • 18444384944 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M. (1991). SHELXTL-Plus. Release 4.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1991) SHELXTL-Plus. Release 4.1
    • Sheldrick, G.M.1
  • 8
    • 3342894903 scopus 로고
    • Stoe & Cie, Darmstadt, Germany
    • Stoe & Cie (1984b). REDU4. Data Reduction Program. Stoe & Cie, Darmstadt, Germany.
    • (1984) REDU4. Data Reduction Program


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.