Simple measurement of 300 K electron capture cross section for EL2 in GaAs

Journal of Applied Physics

Volumn 80, Issue 6, 1996, Pages 3590-3591

  Look, D C ^a   Fang, Z Q ^a  

^a WRIGHT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004749427     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363233     Document Type: Article

References (11)

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