Phase identification in thin oxide films by AES depth profiling

Izvestiya Akademii Nauk. Ser. Fizicheskaya

Volumn 62, Issue 3, 1998, Pages 517-522

  Beshenkov, V G ^a   Znamenskii, A G ^a   Marchenko, V A ^a  

^a NONE

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[No Author keywords available]

Indexed keywords

EID: 0004724129     PISSN: 03676765     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

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