-
1
-
-
0028481037
-
-
Kobayashi, I.; Wakao, Y.; Tominaga, K.; Okada, M. Jpn. J. Appl. Phys., Part 1 1994, 33, 4680.
-
(1994)
Jpn. J. Appl. Phys., Part 1
, vol.33
, pp. 4680
-
-
Kobayashi, I.1
Wakao, Y.2
Tominaga, K.3
Okada, M.4
-
2
-
-
0001702169
-
-
Chandler, C. D.; Roger, C.; Hampden-Smith, M. J. Chem. Rev. 1993, 93, 1205.
-
(1993)
Chem. Rev.
, vol.93
, pp. 1205
-
-
Chandler, C.D.1
Roger, C.2
Hampden-Smith, M.J.3
-
4
-
-
0027668706
-
-
Leskela, M.; Molsa, H.; Niinisto, L. Superconduct. Sci. Technol. 1993, 6, 627.
-
(1993)
Superconduct. Sci. Technol.
, vol.6
, pp. 627
-
-
Leskela, M.1
Molsa, H.2
Niinisto, L.3
-
5
-
-
51649135101
-
-
Special Issue on Wide-Bandgap II-IV Semiconductor Materials. J. Electron. Mater. 1993, 22, 429.
-
(1993)
J. Electron. Mater.
, vol.22
, pp. 429
-
-
-
9
-
-
33748231512
-
-
Hermann, W. A.; Huber, N. W.; Priermeier, T. Angew. Chem. 1994, 33, 105.
-
(1994)
Angew. Chem.
, vol.33
, pp. 105
-
-
Hermann, W.A.1
Huber, N.W.2
Priermeier, T.3
-
10
-
-
0001210727
-
-
Wills, L. A.; Wessels, B. W.; Richeson, D. S.; Marks, T. J. Appl. Phys. Lett. 1992, 60, 41.
-
(1992)
Appl. Phys. Lett.
, vol.60
, pp. 41
-
-
Wills, L.A.1
Wessels, B.W.2
Richeson, D.S.3
Marks, T.J.4
-
11
-
-
33751385924
-
-
Schulz, D. L.; Hinds, B. J.; Neumayer, D. A.; Stern, C. L.; Marks, T. J. Chem. Mater. 1993, 5, 1605.
-
(1993)
Chem. Mater.
, vol.5
, pp. 1605
-
-
Schulz, D.L.1
Hinds, B.J.2
Neumayer, D.A.3
Stern, C.L.4
Marks, T.J.5
-
14
-
-
0013363121
-
-
Hinds, B. J.; Schulz, D. L.; Neumayer, D. A.; Han, B.; Marks, T. J.; Wang, Y. Y.; Dravid, V. P.; Schindler, J. L.; Hogan, T. P.; Kannewurf, C. R. Appl. Phys. Lett. 1994, 65, 231.
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 231
-
-
Hinds, B.J.1
Schulz, D.L.2
Neumayer, D.A.3
Han, B.4
Marks, T.J.5
Wang, Y.Y.6
Dravid, V.P.7
Schindler, J.L.8
Hogan, T.P.9
Kannewurf, C.R.10
-
15
-
-
0029230257
-
-
Helbing, R.; Birecki, H.; DiCarolis, S. A.; Feigelson, R. S.; Hiskes, R. J. Cryst. Growth 1995, 146, 599.
-
(1995)
J. Cryst. Growth
, vol.146
, pp. 599
-
-
Helbing, R.1
Birecki, H.2
DiCarolis, S.A.3
Feigelson, R.S.4
Hiskes, R.5
-
16
-
-
37049113111
-
-
Gaffney, C.; Harrison, P. G.; King, T. J. Chem. Soc., Chem. Commun. 1980, 1251.
-
(1980)
J. Chem. Soc., Chem. Commun.
, pp. 1251
-
-
Gaffney, C.1
Harrison, P.G.2
King, T.3
-
18
-
-
2542569663
-
-
note
-
3SiOH dissolved, the reaction solution was cooled to -50°C and a large excess of anhydrous ammonia gas was condensed into the flask. The solution was allowed to warm to room temperature over a period of 3 h. When all the metal granules were consumed (ca. 3 h) the THF and remaining ammonia were stripped off to yield a waxy white solid. This material was redissolved in 10 mL of fresh THF and left to crystallize in a freezer at -20°C. The yields were 2.65 g, 83.9% (M = Ba) and 2.42 g, 80.4% (M = Sr).
-
-
-
-
19
-
-
2542520963
-
-
note
-
66): C, 60.77 (61.62), H, 6.40 (6.32).
-
-
-
-
20
-
-
2542603231
-
-
note
-
v = 11.1. SHELXL software used for all compounds (Sheldrick, G. Siemens XRD, Madison, WI).
-
-
-
-
21
-
-
0013149686
-
-
Drake, S. R.; Otway, D. J.; Hursthouse, M. B.; Abdul, Malik, K. M. Polyhedron 1992, 11, 1995.
-
(1992)
Polyhedron
, vol.11
, pp. 1995
-
-
Drake, S.R.1
Otway, D.J.2
Hursthouse, M.B.3
Abdul Malik, K.M.4
-
22
-
-
0001618961
-
-
Miele, P.; Foulon, J. D.; Hovnanian, N.; Cot, L. Polyhedron 1993, 12, 267.
-
(1993)
Polyhedron
, vol.12
, pp. 267
-
-
Miele, P.1
Foulon, J.D.2
Hovnanian, N.3
Cot, L.4
-
23
-
-
33748217935
-
-
Caulton, K. G.; Chisholm, M. H.; Drake, S. R.; Streib, W. E. Angew. Chem. 1990, 29, 1483.
-
(1990)
Angew. Chem.
, vol.29
, pp. 1483
-
-
Caulton, K.G.1
Chisholm, M.H.2
Drake, S.R.3
Streib, W.E.4
-
24
-
-
33751390960
-
-
Drake, S. R.; Streib, W. E.; Foiling, K.; Chisholm, M. H.; Caulton, K. G. Inorg. Chem. 1992, 31, 3205.
-
(1992)
Inorg. Chem.
, vol.31
, pp. 3205
-
-
Drake, S.R.1
Streib, W.E.2
Foiling, K.3
Chisholm, M.H.4
Caulton, K.G.5
-
25
-
-
2542633693
-
-
Cryslallographic information, structural details, and other characterization data were deposited as Supporting Information
-
Cryslallographic information, structural details, and other characterization data were deposited as Supporting Information.
-
-
-
|