Detection of the metastable state of the EL2 defect in GaAs

Journal of Applied Physics

Volumn 82, Issue 8, 1997, Pages 4124-4125

  Bourgoin, J C ^a   Neffati, T ^a,b  

^a UNIVERSITÉ PARIS DESCARTES   (France)

^b UNIVERSITÉ DE CERGY PONTOISE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004710631     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365724     Document Type: Article

References (10)

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