Determination of the surface recombination velocity of semiconductor by surface photovoltaic measurement

Applied Physics Letters

Volumn 71, Issue 3, 1997, Pages 407-409

  Yan, Yongmei ^a  

^a XIAMEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004674620     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119552     Document Type: Article

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