XPS analysis of electrochemically oxidized nickel surfaces

Fresenius' Journal of Analytical Chemistry

Volumn 365, Issue 1-3, 1999, Pages 154-157

  Lorenz, M ^a   Schulze, M ^a  

^a GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004654755     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051463     Document Type: Article

References (15)

1. Schiller G, Henne R, Borck V (1995) J Thermal Spray Technol 4: 185
2. Soriega MP (1992) Progress in Surface Science, Vol. 39: 325
3. Bard A et al. (1993) J Phys Chem 97: 7147
4. Schouler EJL, Kleitz M (1987) J Electrochem Soc 134: 1045
5. McBreen J, O'Grady WE, Pandya KI, Hoffman RW, Sayers DE (1987) Eangmuir 3: 428
6. Maurice V, Talah H, Marcus P (1994) Surf Sci 304: 98
7. Yeager E, Homa A, Cahan BD, Scherson D (1982) J Vac Sci Techno 20: 628
8. Woodruff PD, Delchar TA (1986) Modern techniques of surface science; Cambridge University Press
9. Holloway PH, Hudson JB (1974) Surf Sci 43: 141
10. Norton PR, Tapping RL, Goodale JW (1977) Surf Sci 5: 13
11. Wang K, Chottiner GS, Scherson DA (1993) J Phys Chem 97: 10108
12. Hoppe HW, Strehblow HH (1989) Surf and Interface Analysis 14: 121
13. Wagner CD, Riggs WM, Davis LE, Moulder JF, Muilenber GE (1978) Handbook of X-ray photoelectron spectroscopy
14. Schulze M, Reissner R, Lorenz M, Radke U, Schnurnberger W (1999) J Electrochim Acta (in press)
15. Schulze M, Reißner R, Lorenz M (1999) Fresenius J Anal Chem 365 : (this issue)