In situ sensors for monitoring and control in molecular beam epitaxial growth of Hg1-xCdxTe

Journal of Electronic Materials

Volumn 25, Issue 8, 1996, Pages 1371-1374

  Bevan, M J ^a   Duncan, W M ^a   Westphal, G H ^a   Shih, H D ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

HgCdTe; In situ sensors; Scan spectral spectrometer

Indexed keywords

EID: 0004538931     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02655036     Document Type: Article

References (7)

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