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Journal of Applied Physics

Volumn 85, Issue 4, 1999, Pages 2363-2366

Optical characterization of strain-induced structural modification in SiGe-based heterostructures

(3) Usami, N a,b Leo, K a Shiraki, Y b

a DRESDEN UNIVERSITY OF TECHNOLOGY (Germany)

b UNIVERSITY OF TOKYO (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004496483 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.369550 Document Type: Article

Times cited : (17)

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