-
1
-
-
0001408970
-
Two generalizations of the binomial distribution
-
ALTHAM, P. M. E. (1978) Two generalizations of the binomial distribution, Applied Statistics, 27, pp. 162-167.
-
(1978)
Applied Statistics
, vol.27
, pp. 162-167
-
-
Altham, P.M.E.1
-
2
-
-
4243452838
-
The problem of misplaced control limits
-
ALWAN, L. C. & ROBERTS, H. V. (1995) The problem of misplaced control limits, Applied Statistics, 44, pp. 269-278.
-
(1995)
Applied Statistics
, vol.44
, pp. 269-278
-
-
Alwan, L.C.1
Roberts, H.V.2
-
3
-
-
0025444722
-
Attribute control charts for Markov dependent production processes
-
BHAT, U. N. & LAL, R. (1990) Attribute control charts for Markov dependent production processes, IIE Transactions, 22, pp. 181-188.
-
(1990)
IIE Transactions
, vol.22
, pp. 181-188
-
-
Bhat, U.N.1
Lal, R.2
-
4
-
-
0000301055
-
Detecting a shift in fraction nonconforming using run-length control charts with 100% inspection
-
BOURKE, P. D. (1991) Detecting a shift in fraction nonconforming using run-length control charts with 100% inspection, Journal of Quality Technology, 23, pp. 225-238.
-
(1991)
Journal of Quality Technology
, vol.23
, pp. 225-238
-
-
Bourke, P.D.1
-
6
-
-
0020814610
-
Quality control techniques for zero-defects
-
CALVIN, T. W. (1983) Quality control techniques for zero-defects, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, CHMT-6, pp. 323-328.
-
(1983)
IEEE Transactions on Components, Hybrids, and Manufacturing Technology
, vol.CHMT-6
, pp. 323-328
-
-
Calvin, T.W.1
-
8
-
-
0023312888
-
A control chart for very high yield processes
-
GOH, T. N. (1987) A control chart for very high yield processes, Quality Assurance, 13, pp. 18-22.
-
(1987)
Quality Assurance
, vol.13
, pp. 18-22
-
-
Goh, T.N.1
-
10
-
-
1542692269
-
Statistical process control for low nonconformity processes
-
GOH, T. N. & XIE, M. (1995) Statistical process control for low nonconformity processes, International Journal of Reliability, Quality and Safety Engineering, 2, pp. 15-22.
-
(1995)
International Journal of Reliability, Quality and Safety Engineering
, vol.2
, pp. 15-22
-
-
Goh, T.N.1
Xie, M.2
-
11
-
-
0018189663
-
The use of a correlated binomial model for analysis of certain toxicological experiments
-
KUPPER, L. L. & HASEMAN, J. K. (1978) The use of a correlated binomial model for analysis of certain toxicological experiments, Biometrics, 34, pp. 69-76.
-
(1978)
Biometrics
, vol.34
, pp. 69-76
-
-
Kupper, L.L.1
Haseman, J.K.2
-
12
-
-
0011750493
-
Control scheme for low count levels
-
LUCAS, J. M. (1989) Control scheme for low count levels, Journal of Quality Technology, 21, pp. 199-201.
-
(1989)
Journal of Quality Technology
, vol.21
, pp. 199-201
-
-
Lucas, J.M.1
-
14
-
-
0001367301
-
Probability limits on outgoing quality for continuous sampling plans
-
MCSHANE, L. M. & TURNBULL, B. W. (1991) Probability limits on outgoing quality for continuous sampling plans, Technometrics, 33, pp. 393-404.
-
(1991)
Technometrics
, vol.33
, pp. 393-404
-
-
Mcshane, L.M.1
Turnbull, B.W.2
-
15
-
-
0028468202
-
A control chart for parts-per-million nonconforming items
-
NELSON, L. S. (1994) A control chart for parts-per-million nonconforming items, Journal of Quality Technology, 26, pp. 239-240.
-
(1994)
Journal of Quality Technology
, vol.26
, pp. 239-240
-
-
Nelson, L.S.1
-
16
-
-
0013199072
-
A new class of modified binomial distributions with applications to certain toxicological experiments
-
NG, T. (1989) A new class of modified binomial distributions with applications to certain toxicological experiments, Communications in Statistics: Theory and Methods, 18, pp. 3477-3492.
-
(1989)
Communications in Statistics: Theory and Methods
, vol.18
, pp. 3477-3492
-
-
Ng, T.1
-
17
-
-
0009179314
-
A three-parameter generalization of the binomial distribution
-
PAUL, S. R. (1985) A three-parameter generalization of the binomial distribution, Communications in Statistics: Theory and Methods, 14, pp. 1496-1506.
-
(1985)
Communications in Statistics: Theory and Methods
, vol.14
, pp. 1496-1506
-
-
Paul, S.R.1
-
18
-
-
0001636841
-
On the beta-correlated binomial (BCB) distribution - A three-parameter generalization of the binomial distribution
-
PAUL, S. R. (1987) On the beta-correlated binomial (BCB) distribution - a three-parameter generalization of the binomial distribution, Communications in Statistics: Theory and Methods, 16, pp. 1473-1478.
-
(1987)
Communications in Statistics: Theory and Methods
, vol.16
, pp. 1473-1478
-
-
Paul, S.R.1
-
19
-
-
0004536777
-
Plans for very low fraction nonconforming
-
PESOTCHINSKY, L. (1987) Plans for very low fraction nonconforming, Journal of Quality Technology, 19, pp. 191-196.
-
(1987)
Journal of Quality Technology
, vol.19
, pp. 191-196
-
-
Pesotchinsky, L.1
-
20
-
-
0011598906
-
A Markov chain model of extrabinomial variation
-
RUDOLFER, S. M. (1990) A Markov chain model of extrabinomial variation, Biometrika, 77, pp. 255-264.
-
(1990)
Biometrika
, vol.77
, pp. 255-264
-
-
Rudolfer, S.M.1
-
21
-
-
0029386377
-
Model based and model-free control of automated processes
-
RUNGER, G. C. & WILLEMAIN, T. R. (1995) Model based and model-free control of automated processes, Journal of Quality Technology, 27, pp. 283-292.
-
(1995)
Journal of Quality Technology
, vol.27
, pp. 283-292
-
-
Runger, G.C.1
Willemain, T.R.2
-
22
-
-
0030165967
-
Batch-means control charts for au to correlated data
-
RUNGER, G. C. & WILLEMAIN, T. R. (1996) Batch-means control charts for au to correlated data, IIE Transactions, 28, pp. 483-487.
-
(1996)
IIE Transactions
, vol.28
, pp. 483-487
-
-
Runger, G.C.1
Willemain, T.R.2
-
23
-
-
0023440281
-
Continuous sampling plans for Markov-dependent production process
-
SAMPATH KUMAR, V. S. & RAJARSHI, M. B. (1987) Continuous sampling plans for Markov-dependent production process, Naval Research Logistics, 34, pp. 629-644.
-
(1987)
Naval Research Logistics
, vol.34
, pp. 629-644
-
-
Sampath Kumar, V.S.1
Rajarshi, M.B.2
-
24
-
-
0030190295
-
Monitoring serially-dependent process with attributes data
-
STIMSON, W. A. & MASTERANGELO, C. M. (1996) Monitoring serially-dependent process with attributes data, Journal of Quality Technology, 28, pp. 279-288.
-
(1996)
Journal of Quality Technology
, vol.28
, pp. 279-288
-
-
Stimson, W.A.1
Masterangelo, C.M.2
-
26
-
-
84952149041
-
Run length distributions of special cause control charts for correlated processes
-
WARDEL, D. G., MOSKOWITZ, H. & PLANTEI, R. D. (1994) Run length distributions of special cause control charts for correlated processes, Technometrics, 36, pp. 3-22.
-
(1994)
Technometrics
, vol.36
, pp. 3-22
-
-
Wardel, D.G.1
Moskowitz, H.2
Plantei, R.D.3
-
28
-
-
0029368187
-
Control charts for processes subject to random shocks
-
XIE, W., XIE, M. & GOH, T. N. (1995) Control charts for processes subject to random shocks, Quality and Reliability Engineering International, 11, pp. 355-360.
-
(1995)
Quality and Reliability Engineering International
, vol.11
, pp. 355-360
-
-
Xie, W.1
Xie, M.2
Goh, T.N.3
|