Fourier–transformation, phase–iteration, and least–square–fit image processing for Young’s fringe pattern

Applied Optics

Volumn 35, Issue 2, 1996, Pages 232-239

  Gu, Jie ^a   Chen, Fang ^a  

^a Oakland University   (United States)

Author keywords

Fast Fourier transform; Least square fit; Phase iteration; Young s pattern

Indexed keywords

EID: 0004438028     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.000232     Document Type: Article

References (10)

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