Particle mass spectrometer (PMS) and its application to nano-particle sizing in various systems

KONA Powder and Particle Journal

Volumn 17, Issue May, 1999, Pages 114-121

  Janzen, Christian ^a   Strecker, Marc G D ^a   Roth, Paul ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRON MULTIPLIERS; MASS SPECTROMETERS; MASS SPECTROMETRY; PARTICLE SIZE; SECONDARY EMISSION;

DIAGNOSTIC TECHNIQUES; ITS APPLICATIONS; MICROWAVE REACTORS; PARTICLE FORMATIONS; PARTICLE MASS SPECTROMETERS; PARTICLE MASS SPECTROMETRY; SECONDARY ELECTRON MULTIPLIERS; SIZE AND SIZE DISTRIBUTIONS;

NANOPARTICLES;

EID: 0004436634     PISSN: 02884534     EISSN: 21875537     Source Type: Journal    
DOI: 10.14356/kona.1999018     Document Type: Article

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