Surface impedance of YBa2Cu3O7-x thin film grain boundary Josephson junctions: Evaluation of the IcR n product

Journal of Applied Physics

Volumn 75, Issue 9, 1994, Pages 4581-4587

  Hein, M A ^a   Strupp, M ^a   Piel, H ^a   Portis, A M ^b   Gross, R ^c  

^a UNIVERSITY OF WUPPERTAL   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004405597     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.355953     Document Type: Review

References (0)