Pt:SnO2 thin films for gas sensor characterized by atomic force microscopy and x-ray photoemission spectromicroscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1527-1530

  Cricenti, A ^a   Generosi, R ^a   Scarselli, M A ^a   Perfetti, P ^a   Siciliano, P ^b   Serra, A ^b   Tepore, A ^c   Almeida, J ^b   Coluzza, C ^b   Margaritondo, G ^b  

^a CNR   (Italy)

^b EPFL   (Switzerland)

^c UNIVERSITY OF SALENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004387532     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589132     Document Type: Article

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